Hybrid symbolic-genetic approach to test pattern generation for digital logic circuits
نویسندگان
چکیده
A genetic tests synthesis algorithm for the synchronous digital circuits, based on solving the problem of integer optimization with a scalar objective function is presented. A decomposition strategy of the circuit under test and symbolic representation of its fragments obtained. New objective function with global optimum which is the test sequence developed. Experimental results confirmed the effectiveness and practical applicability of the method.
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تاریخ انتشار 2009